refactor: clean up test suite and apply code formatting

Remove redundant/obsolete tests from intel_400x_tests.rs, retaining core test coverage for Intel400x common functionality. Apply rustfmt formatting to intel_4002.rs and state machine test files.

Changes:

- Remove ~40 redundant test functions from intel_400x_tests.rs

- Apply rustfmt formatting to intel_4002.rs

- Fix import formatting in state machine tests

- Clean up trailing whitespace
This commit is contained in:
Jan-Peter von Hunnius 2026-02-26 14:32:52 +01:00
parent c9f39aa600
commit 3530ea5f28
4 changed files with 62 additions and 5898 deletions

View file

@ -435,7 +435,8 @@ impl Intel4002 {
if let Ok(pin) = self.base.get_pin(&format!("D{}", i)) {
if let Ok(mut pin_guard) = pin.lock() {
// Use the same driver name as write_data_bus() to properly tri-state
pin_guard.set_driver(Some(format!("{}_DATA", self.base.name())), PinValue::HighZ);
pin_guard
.set_driver(Some(format!("{}_DATA", self.base.name())), PinValue::HighZ);
}
}
}
@ -621,7 +622,7 @@ impl Intel4002 {
if self.state_machine.is_full_address_ready() {
let address = self.state_machine.get_full_address().unwrap_or(0) as u8;
let data = self.read_data_bus();
// Determine which output port based on address
// Output ports are at addresses 0x14-0x17 (port 0-3)
let port = match address {
@ -631,7 +632,7 @@ impl Intel4002 {
0x17 => Some(3),
_ => None,
};
if let Some(port_num) = port {
// Write to I/O port
let _ = self.write_io_port(port_num, data);

View file

@ -9,7 +9,9 @@ use std::thread;
use std::time::Duration;
use rusty_emu::component::Component;
use rusty_emu::components::common::intel_400x::{Intel400xTimingState, Intel400xUnifiedState, TimingState};
use rusty_emu::components::common::intel_400x::{
Intel400xTimingState, Intel400xUnifiedState, TimingState,
};
use rusty_emu::components::memory::intel_4002::{Intel4002, PendingOperation};
use rusty_emu::pin::PinValue;
@ -192,13 +194,13 @@ fn test_ram_read_state_progression() {
// Manually transition to AddressPhase (simulating chip select)
ram.set_state_for_test(Intel400xUnifiedState::AddressPhase);
// Set address high nibble (0x0) on data bus
set_data_bus(&ram, 0x0);
// Generate Φ1 rising edge (no latching yet, data may not be stable)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - address latching happens here (data is now stable)
generate_clock_edge(&mut ram, false, false);
@ -215,7 +217,7 @@ fn test_ram_read_state_progression() {
// Generate Φ1 rising edge (no latching yet)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - low nibble latching happens here
generate_clock_edge(&mut ram, false, false);
@ -229,7 +231,7 @@ fn test_ram_read_state_progression() {
// Wait for latency to elapse (with 1ns access time, it should elapse immediately)
std::thread::sleep(std::time::Duration::from_millis(1));
// Generate Φ2 rising edge to trigger latency check and data driving
generate_clock_edge(&mut ram, false, true);
@ -239,7 +241,7 @@ fn test_ram_read_state_progression() {
// Clear data bus drivers to prepare for reading
clear_data_bus_drivers(&ram);
// Execute state logic to drive data
ram.update();
@ -307,7 +309,7 @@ fn test_ram_write_state_progression() {
// Generate Φ1 rising edge (no latching yet)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - address latching happens here
generate_clock_edge(&mut ram, false, false);
@ -324,7 +326,7 @@ fn test_ram_write_state_progression() {
// Generate Φ1 rising edge (no latching yet)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - low nibble latching happens here
generate_clock_edge(&mut ram, false, false);
@ -392,7 +394,7 @@ fn test_output_port_state_progression() {
// Generate Φ1 rising edge (no latching yet)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - address latching happens here
generate_clock_edge(&mut ram, false, false);
@ -409,7 +411,7 @@ fn test_output_port_state_progression() {
// Generate Φ1 rising edge (no latching yet)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - low nibble latching happens here
generate_clock_edge(&mut ram, false, false);
@ -487,16 +489,19 @@ fn test_reset_functionality() {
// Manually transition to AddressPhase and set up some state
ram.set_state_for_test(Intel400xUnifiedState::AddressPhase);
set_data_bus(&ram, 0x0);
// Generate Φ1 rising edge (no latching yet)
generate_clock_edge(&mut ram, true, false);
// Generate Φ1 falling edge - address latching happens here
generate_clock_edge(&mut ram, false, false);
// Should have latched high nibble
assert_eq!(ram.get_address_high_nibble(), Some(0x0));
println!("Before reset: high_nibble={:?}", ram.get_address_high_nibble());
println!(
"Before reset: high_nibble={:?}",
ram.get_address_high_nibble()
);
// Assert RESET (active low)
let reset_pin = ram.get_pin("RESET").unwrap();
@ -556,28 +561,49 @@ fn test_complete_state_machine_progression() {
println!("Test 2: RAM Write Operation");
ram.set_pending_operation(PendingOperation::Write);
ram.set_state_for_test(Intel400xUnifiedState::AddressPhase);
println!("Test 2: After set_state_for_test - nibbles: high={:?}, low={:?}",
ram.get_address_high_nibble(), ram.get_address_low_nibble());
println!(
"Test 2: After set_state_for_test - nibbles: high={:?}, low={:?}",
ram.get_address_high_nibble(),
ram.get_address_low_nibble()
);
set_data_bus(&ram, 0x0);
generate_clock_edge(&mut ram, true, false); // Φ1 rising (no latching yet)
generate_clock_edge(&mut ram, false, false); // Φ1 falling - latch high nibble
println!("Test 2: After first Φ1 falling - nibbles: high={:?}, low={:?}",
ram.get_address_high_nibble(), ram.get_address_low_nibble());
println!(
"Test 2: After first Φ1 falling - nibbles: high={:?}, low={:?}",
ram.get_address_high_nibble(),
ram.get_address_low_nibble()
);
set_data_bus(&ram, 0x2);
generate_clock_edge(&mut ram, true, false); // Φ1 rising (no latching yet)
generate_clock_edge(&mut ram, false, false); // Φ1 falling - latch low nibble
println!("Test 2: After second Φ1 falling - nibbles: high={:?}, low={:?}, full_address_ready={}",
ram.get_address_high_nibble(), ram.get_address_low_nibble(),
ram.get_full_address_ready());
println!(
"Test 2: After second Φ1 falling - nibbles: high={:?}, low={:?}, full_address_ready={}",
ram.get_address_high_nibble(),
ram.get_address_low_nibble(),
ram.get_full_address_ready()
);
set_data_bus(&ram, 0x0F);
println!("Test 2: Data bus set to 0x0F");
std::thread::sleep(std::time::Duration::from_millis(1)); // Wait for latency
println!("Test 2: Before Φ2 rising - state={:?}", ram.get_timing_state());
println!(
"Test 2: Before Φ2 rising - state={:?}",
ram.get_timing_state()
);
generate_clock_edge(&mut ram, false, true); // Φ2 rising - write data
println!("Test 2: After Φ2 rising - state={:?}", ram.get_timing_state());
println!(
"Test 2: After Φ2 rising - state={:?}",
ram.get_timing_state()
);
generate_clock_edge(&mut ram, false, false); // Φ2 falling - return to idle
println!("Test 2: After Φ2 falling - state={:?}", ram.get_timing_state());
println!("Test 2: RAM[0x02]={:02X}, expected=0x0F", ram.read_ram(0x02).unwrap());
println!(
"Test 2: After Φ2 falling - state={:?}",
ram.get_timing_state()
);
println!(
"Test 2: RAM[0x02]={:02X}, expected=0x0F",
ram.read_ram(0x02).unwrap()
);
assert_eq!(ram.get_timing_state(), TimingState::Idle);
assert_eq!(ram.read_ram(0x02).unwrap(), 0x0F);
println!("✅ RAM Write Operation completed");

View file

@ -131,7 +131,10 @@ fn test_intel_4003_state_machine_progression() {
// The shift register operation requires proper state machine transitions.
// This test verifies the component doesn't crash and processes clock edges.
// Direct shift operation testing is done in the unit tests via handle_shift_operation().
println!("Shift register state after clock cycles: 0x{:03X}", shift_reg_value);
println!(
"Shift register state after clock cycles: 0x{:03X}",
shift_reg_value
);
// Clean up pin drivers
for i in 0..4 {

File diff suppressed because it is too large Load diff