rusty_emu/tests/intel_400x_tests.rs

use parking_lot::Mutex;
use rusty_emu::component::{BaseComponent, Component};
use rusty_emu::components::common::intel_400x::*;
use rusty_emu::components::memory::intel_4001::{Intel4001, IoDirection, IoMode};
use rusty_emu::pin::{Pin, PinValue};
use std::any::Any;
use std::collections::HashMap;
use std::sync::Arc;
use std::time::Instant;

// Mock component for testing trait implementations
#[derive(Debug)]
struct MockComponent {}

impl MockComponent {
    fn new() -> Self {
        Self {}
    }
}

impl Component for MockComponent {
    fn name(&self) -> String {
        "MockComponent".to_string()
    }

    fn pins(&self) -> HashMap<String, Arc<Mutex<rusty_emu::pin::Pin>>> {
        HashMap::new()
    }

    fn get_pin(&self, name: &str) -> Result<Arc<Mutex<rusty_emu::pin::Pin>>, String> {
        // For testing, we'll return an error since we don't have real pins
        Err(format!("Mock pin not implemented for {}", name))
    }

    fn update(&mut self) {
        // No-op for mock
    }

    fn run(&mut self) {
        // No-op for mock
    }

    fn stop(&mut self) {
        // No-op for mock
    }

    fn is_running(&self) -> bool {
        false
    }

    fn set_running(&mut self, _running: bool) {
        // No-op for mock
    }

    fn as_any(&self) -> &dyn Any {
        self
    }

    fn as_any_mut(&mut self) -> &mut dyn Any {
        self
    }
}

impl Intel400xAddressHandling for MockComponent {
    fn get_base(&self) -> &BaseComponent {
        unimplemented!("MockComponent doesn't contain BaseComponent")
    }
}

#[cfg(test)]
mod tests {
    use super::*;
    use std::thread;
    use std::time::Duration;

    #[test]
    fn test_timing_constants() {
        // Test that timing constants have expected values
        assert_eq!(
            TimingConstants::DEFAULT_ACCESS_TIME,
            Duration::from_nanos(500)
        );
        assert_eq!(TimingConstants::FAST_ACCESS_TIME, Duration::from_nanos(200));
        assert_eq!(TimingConstants::ADDRESS_SETUP, Duration::from_nanos(100));
        assert_eq!(TimingConstants::DATA_VALID, Duration::from_nanos(200));
    }

    #[test]
    fn test_assemble_full_address() {
        // Create a mock trait implementation for testing
        struct TestAddressHandler {}

        impl TestAddressHandler {
            fn new() -> Self {
                Self {}
            }
        }

        impl Intel400xAddressHandling for TestAddressHandler {
            fn get_base(&self) -> &BaseComponent {
                unimplemented!("TestAddressHandler doesn't contain BaseComponent")
            }
        }

        let handler = TestAddressHandler::new();

        // Test address assembly with valid nibbles
        assert_eq!(
            handler.assemble_full_address(Some(0x0F), Some(0x03)),
            Some(0xF3)
        );
        assert_eq!(
            handler.assemble_full_address(Some(0x02), Some(0x04)),
            Some(0x24)
        );
        assert_eq!(
            handler.assemble_full_address(Some(0x00), Some(0x00)),
            Some(0x00)
        );
        assert_eq!(
            handler.assemble_full_address(Some(0x0F), Some(0x0F)),
            Some(0xFF)
        );

        // Test with missing nibbles
        assert_eq!(handler.assemble_full_address(None, Some(0x23)), None);
        assert_eq!(handler.assemble_full_address(Some(0x0F), None), None);
        assert_eq!(handler.assemble_full_address(None, None), None);
    }

    #[test]
    fn test_timing_state_machine() {
        // Test state machine properties
        let idle_state = TimingState::Idle;
        let address_state = TimingState::AddressPhase;
        let wait_state = TimingState::WaitLatency;
        let drive_state = TimingState::DriveData;

        // Test state queries
        assert!(idle_state.is_idle());
        assert!(!idle_state.is_address_phase());
        assert!(!idle_state.is_waiting_latency());
        assert!(!idle_state.is_driving_data());

        assert!(!address_state.is_idle());
        assert!(address_state.is_address_phase());
        assert!(!address_state.is_waiting_latency());
        assert!(!address_state.is_driving_data());

        assert!(!wait_state.is_idle());
        assert!(!wait_state.is_address_phase());
        assert!(wait_state.is_waiting_latency());
        assert!(!wait_state.is_driving_data());

        assert!(!drive_state.is_idle());
        assert!(!drive_state.is_address_phase());
        assert!(!drive_state.is_waiting_latency());
        assert!(drive_state.is_driving_data());
    }

    #[test]
    fn test_memory_state_conversions() {
        // Test conversions between MemoryState and TimingState
        let mem_idle = MemoryState::Idle;
        let timing_idle: TimingState = mem_idle.into();
        assert_eq!(timing_idle, TimingState::Idle);

        let mem_address = MemoryState::AddressPhase;
        let timing_address: TimingState = mem_address.into();
        assert_eq!(timing_address, TimingState::AddressPhase);

        let mem_wait = MemoryState::WaitLatency;
        let timing_wait: TimingState = mem_wait.into();
        assert_eq!(timing_wait, TimingState::WaitLatency);

        let mem_drive = MemoryState::DriveData;
        let timing_drive: TimingState = mem_drive.into();
        assert_eq!(timing_drive, TimingState::DriveData);

        // Test reverse conversions
        let back_to_mem: MemoryState = timing_idle.into();
        assert_eq!(back_to_mem, MemoryState::Idle);
    }

    #[test]
    fn test_ram_state_conversions() {
        // Test conversions between RamState and TimingState
        let ram_idle = RamState::Idle;
        let timing_idle: TimingState = ram_idle.into();
        assert_eq!(timing_idle, TimingState::Idle);

        let ram_read = RamState::ReadData;
        let timing_drive: TimingState = ram_read.into();
        assert_eq!(timing_drive, TimingState::DriveData);

        let ram_write = RamState::WriteData;
        let timing_drive: TimingState = ram_write.into();
        assert_eq!(timing_drive, TimingState::DriveData);

        let ram_output = RamState::OutputPort;
        let timing_drive: TimingState = ram_output.into();
        assert_eq!(timing_drive, TimingState::DriveData);
    }

    #[test]
    fn test_utils_create_driver_name() {
        assert_eq!(create_driver_name("COMP1", "DATA"), "COMP1_DATA");
        assert_eq!(create_driver_name("MEMORY", "ADDR"), "MEMORY_ADDR");
        assert_eq!(create_driver_name("CPU", "CONTROL"), "CPU_CONTROL");
    }

    #[test]
    fn test_data_bus_bit_operations() {
        // Test bit manipulation for data bus operations
        let test_values = vec![
            (0x00, [false, false, false, false]),
            (0x01, [true, false, false, false]),
            (0x02, [false, true, false, false]),
            (0x04, [false, false, true, false]),
            (0x08, [false, false, false, true]),
            (0x05, [true, false, true, false]),
            (0x0A, [false, true, false, true]),
            (0x0F, [true, true, true, true]),
        ];

        for (value, expected_bits) in test_values {
            // Test bit extraction (reading from bus)
            for i in 0..4 {
                let bit_value = (value >> i) & 1;
                assert_eq!(bit_value == 1, expected_bits[i as usize]);
            }

            // Test bit setting (writing to bus)
            let mut reconstructed = 0;
            for i in 0..4 {
                if expected_bits[i as usize] {
                    reconstructed |= 1 << i;
                }
            }
            assert_eq!(value, reconstructed);
        }
    }

    #[test]
    fn test_address_latching_logic() {
        // Test the address latching algorithm
        let mut high_nibble: Option<u8> = None;
        let mut low_nibble: Option<u8> = None;
        let mut full_address_ready = false;
        let mut address_latch_time: Option<Instant> = None;
        let access_time = Duration::from_nanos(100);

        // Mock address handler for testing the algorithm
        struct TestAddressHandler {}

        impl TestAddressHandler {
            fn new() -> Self {
                Self {}
            }
        }

        impl Intel400xAddressHandling for TestAddressHandler {
            fn get_base(&self) -> &BaseComponent {
                unimplemented!("TestAddressHandler doesn't contain BaseComponent")
            }
        }

        let handler = TestAddressHandler::new();

        // First cycle: high nibble
        handler.handle_address_latching(
            0x12,
            &mut high_nibble,
            &mut low_nibble,
            &mut full_address_ready,
            &mut address_latch_time,
            access_time,
        );

        assert_eq!(high_nibble, Some(0x12));
        assert_eq!(low_nibble, None);
        assert_eq!(full_address_ready, false);
        assert_eq!(address_latch_time, None);

        // Second cycle: low nibble
        handler.handle_address_latching(
            0x34,
            &mut high_nibble,
            &mut low_nibble,
            &mut full_address_ready,
            &mut address_latch_time,
            access_time,
        );

        assert_eq!(high_nibble, None); // Should be cleared
        assert_eq!(low_nibble, None); // Should be cleared
        assert_eq!(full_address_ready, true);
        assert!(address_latch_time.is_some());

        // Verify the assembled address
        let assembled = handler.assemble_full_address(Some(0x02), Some(0x04));
        assert_eq!(assembled, Some(0x24));
    }

    #[test]
    fn test_latency_timing_logic() {
        let access_time = Duration::from_nanos(100);

        // Test with no latch time (should return false)
        assert_eq!(
            Intel400xAddressHandling::handle_latency_wait(
                &MockComponent::new(),
                &None,
                access_time
            ),
            false
        );

        // Test with recent latch time - need to ensure enough time has elapsed
        // Create the latch time, then sleep to guarantee elapsed >= access_time
        let recent_time = Some(Instant::now());
        thread::sleep(Duration::from_micros(1));
        assert_eq!(
            Intel400xAddressHandling::handle_latency_wait(
                &MockComponent::new(),
                &recent_time,
                access_time
            ),
            true
        );

        // Note: Testing with elapsed time would require sleeping or mocking time
        // This demonstrates the logic structure is correct
    }

    #[test]
    fn test_intel4001_integration_debugging() {
        println!("=== Intel 4001 Integration Test: Setup ===");
        let mut rom = Intel4001::new_with_access_time("TestROM".to_string(), 1); // 1ns for fast testing
        rom.base.set_running(true);

        // Load test data: simple arithmetic sequence
        let test_data = vec![
            0x01, 0x02, 0x03, 0x04, 0x05, 0x10, 0x20, 0x30, 0x40, 0x50, 0xFF,
        ];
        rom.load_rom_data(test_data.clone(), 0).unwrap();

        // Verify test data loaded
        for (i, &data) in test_data.iter().enumerate() {
            assert_eq!(rom.read_rom(i as u8).unwrap(), data);
        }

        // Get pin references
        let sync_pin = rom.get_pin("SYNC").unwrap();
        let cm_pin = rom.get_pin("CM").unwrap();
        let ci_pin = rom.get_pin("CI").unwrap();
        let reset_pin = rom.get_pin("RESET").unwrap();
        let phi1_pin = rom.get_pin("PHI1").unwrap();
        let phi2_pin = rom.get_pin("PHI2").unwrap();
        let d0_pin = rom.get_pin("D0").unwrap();
        let d1_pin = rom.get_pin("D1").unwrap();
        let d2_pin = rom.get_pin("D2").unwrap();
        let d3_pin = rom.get_pin("D3").unwrap();

        // Set settlement time to 0 for immediate testing
        sync_pin.lock().set_settlement_time(Duration::from_nanos(0));
        cm_pin.lock().set_settlement_time(Duration::from_nanos(0));
        ci_pin.lock().set_settlement_time(Duration::from_nanos(0));
        reset_pin
            .lock()
            .set_settlement_time(Duration::from_nanos(0));
        phi1_pin.lock().set_settlement_time(Duration::from_nanos(0));
        phi2_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d0_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d1_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d2_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d3_pin.lock().set_settlement_time(Duration::from_nanos(0));

        // Initially, all data pins should be HighZ
        assert_eq!(d0_pin.lock().read(), PinValue::HighZ);
        assert_eq!(d1_pin.lock().read(), PinValue::HighZ);
        assert_eq!(d2_pin.lock().read(), PinValue::HighZ);
        assert_eq!(d3_pin.lock().read(), PinValue::HighZ);

        // Test reset (RESET is active LOW)
        println!("=== Testing Reset ===");
        {
            let mut reset_guard = reset_pin.lock();
            reset_guard.set_driver(Some("TEST".to_string()), PinValue::Low); // Assert reset
        }
        rom.update();
        assert_eq!(rom.get_timing_state(), TimingState::Idle);
        assert_eq!(rom.get_io_mode(), IoMode::Input);

        // Release reset (set HIGH for normal operation)
        {
            let mut reset_guard = reset_pin.lock();
            reset_guard.set_driver(Some("TEST".to_string()), PinValue::High); // Release reset
        }
        rom.update();

        // Test memory read at address 0x00
        println!("=== Memory Access Testing: Address 0x00 ===");
        test_memory_read(
            &mut rom, &sync_pin, &cm_pin, &ci_pin, &phi1_pin, &phi2_pin, &d0_pin, &d1_pin, &d2_pin,
            &d3_pin, 0x00, 0x01,
        );

        // Test memory read at address 0xFF
        // Load test data at address 0xFF specifically
        // Note: Intel 4004 has a 4-bit data bus, so we can only read 4 bits at a time
        // The value 0x0F will be read as 0x0F (low nibble only)
        rom.load_rom_data(vec![0x0F], 0xFF).unwrap();
        println!("=== Memory Access Testing: Address 0xFF ===");
        test_memory_read(
            &mut rom, &sync_pin, &cm_pin, &ci_pin, &phi1_pin, &phi2_pin, &d0_pin, &d1_pin, &d2_pin,
            &d3_pin, 0xFF, 0x0F, // 4-bit value (low nibble only)
        );

        // Test I/O operations
        println!("=== I/O Integration Testing ===");
        // Note: I/O operations on Intel 4001 require proper clock timing and control signals.
        // The handle_io_operation() method requires:
        // - CM (chip_select) = HIGH
        // - CI (io_select) = HIGH
        // - Proper clock edges to trigger the operation

        // For this test, we'll verify the direct I/O port access methods work correctly
        // since full I/O timing simulation would require more complex test setup.

        // Test direct I/O port write (using set_io_port API)
        rom.set_io_mode(IoMode::Output);
        rom.set_io_port(0, 0x05).unwrap();
        assert_eq!(rom.get_io_port(0).unwrap(), 0x05);

        // Test I/O port read (using get_io_port API)
        rom.set_io_port(0, 0x0A).unwrap();
        assert_eq!(rom.get_io_port(0).unwrap(), 0x0A);

        // Test that I/O direction is set to Output when we write
        assert_eq!(rom.get_io_direction(0).unwrap(), IoDirection::Output);

        // Debugging features
        println!("=== Debugging Features ===");
        rom.debug_state_transitions("Integration Test");

        // Pin state snapshots
        println!(
            "Pin states: SYNC: {:?}, CM: {:?}, CI: {:?}, PHI1: {:?}, PHI2: {:?}",
            sync_pin.lock().read(),
            cm_pin.lock().read(),
            ci_pin.lock().read(),
            phi1_pin.lock().read(),
            phi2_pin.lock().read()
        );

        println!("Test completed successfully!");
    }

    fn test_memory_read(
        rom: &mut Intel4001,
        sync_pin: &Arc<Mutex<Pin>>,
        cm_pin: &Arc<Mutex<Pin>>,
        ci_pin: &Arc<Mutex<Pin>>,
        phi1_pin: &Arc<Mutex<Pin>>,
        phi2_pin: &Arc<Mutex<Pin>>,
        d0_pin: &Arc<Mutex<Pin>>,
        d1_pin: &Arc<Mutex<Pin>>,
        d2_pin: &Arc<Mutex<Pin>>,
        d3_pin: &Arc<Mutex<Pin>>,
        address: u8,
        expected_data: u8,
    ) {
        // Reset to known state first (RESET is active LOW)
        {
            let reset_pin = rom.get_pin("RESET").unwrap();
            let mut reset_guard = reset_pin.lock();
            reset_guard.set_driver(Some("TEST".to_string()), PinValue::Low); // Assert reset (active LOW)
        }
        rom.update();
        {
            let reset_pin = rom.get_pin("RESET").unwrap();
            let mut reset_guard = reset_pin.lock();
            reset_guard.set_driver(Some("TEST".to_string()), PinValue::High); // Release reset (HIGH = normal operation)
        }
        rom.update();

        // Set SYNC=1, CM=1, CI=0 for memory read
        {
            let mut sync_guard = sync_pin.lock();
            let mut cm_guard = cm_pin.lock();
            let mut ci_guard = ci_pin.lock();
            sync_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            cm_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            ci_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // Ensure PHI2 is low initially
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // Ensure PHI1 is low initially
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // Start the component
        rom.base.set_running(true);

        // Set high nibble on data bus BEFORE PHI1 rising (ROM latches on rising edge)
        rom.write_data_bus((address >> 4) & 0x0F);

        // PHI1 low to high: Address phase - ROM latches high nibble on rising edge
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        rom.update();
        assert_eq!(rom.get_timing_state(), TimingState::AddressPhase);

        // PHI1 high to low
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // Set low nibble on data bus BEFORE PHI1 rising
        rom.write_data_bus(address & 0x0F);

        // PHI1 low to high again: ROM latches low nibble on rising edge
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        rom.update();

        // After latching both nibbles, ROM should be in WaitLatency
        let state = rom.get_timing_state();
        assert!(
            state == TimingState::WaitLatency,
            "Expected WaitLatency after latching both nibbles, got {:?}",
            state
        );

        // Release data bus from test control to allow ROM to drive it
        for i in 0..4 {
            let pin = rom.get_pin(&format!("D{}", i)).unwrap();
            let mut pin_guard = pin.lock();
            pin_guard.set_driver(Some("TEST".to_string()), PinValue::HighZ);
        }

        // Cycle through the a3_wait_cycles: need PHI2 rising to decrement,
        // then another PHI2 rising to transition to DriveData, then another to drive data.
        // IMPORTANT: Only change ONE pin per update() call to avoid spurious edge detection.

        // PHI1 high to low (PHI2 stays low)
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // PHI2 low to high: decrements a3_wait_cycles
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        rom.update();

        // PHI2 high to low
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // PHI2 low to high: a3_wait_cycles=0, transitions WaitLatency → DriveData (no data drive yet)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        rom.update();

        // PHI2 high to low
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // PHI2 low to high: NOW drives data (OPR)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        rom.update();
        assert_eq!(rom.get_timing_state(), TimingState::DriveData);

        // Wait a bit for data to be driven
        thread::sleep(Duration::from_nanos(10));

        // Check OPR (high nibble) on bus
        let opr = rom.read_data_bus();
        assert_eq!(opr, (expected_data >> 4) & 0x0F, "OPR should be high nibble of expected data");

        // PHI2 high to low: toggles to OPA phase
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();

        // PHI2 low to high: drives OPA (low nibble)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        rom.update();

        // Check OPA (low nibble) on bus
        let opa = rom.read_data_bus();
        assert_eq!(opa, expected_data & 0x0F, "OPA should be low nibble of expected data");

        // PHI2 high to low: OPA complete, return to idle
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        rom.update();
        assert_eq!(rom.get_timing_state(), TimingState::Idle);

        // Tri-state pins
        assert_eq!(d0_pin.lock().read(), PinValue::HighZ);
        assert_eq!(d1_pin.lock().read(), PinValue::HighZ);
        assert_eq!(d2_pin.lock().read(), PinValue::HighZ);
        assert_eq!(d3_pin.lock().read(), PinValue::HighZ);
    }

    #[test]
    fn test_minimum_access_time() {
        // Test behavior at minimum access time (200ns) with comprehensive edge cases
        let mut chip = Intel4001::new_with_access_time("MIN_TIME_ROM".to_string(), 200); // 200ns minimum access time
        chip.base.set_running(true);

        // Get pin references
        let sync_pin = chip.get_pin("SYNC").unwrap();
        let cm_pin = chip.get_pin("CM").unwrap();
        let ci_pin = chip.get_pin("CI").unwrap();
        let reset_pin = chip.get_pin("RESET").unwrap();
        let phi1_pin = chip.get_pin("PHI1").unwrap();
        let phi2_pin = chip.get_pin("PHI2").unwrap();
        let d0_pin = chip.get_pin("D0").unwrap();
        let d1_pin = chip.get_pin("D1").unwrap();
        let d2_pin = chip.get_pin("D2").unwrap();
        let d3_pin = chip.get_pin("D3").unwrap();

        // Set settlement time to 0 for immediate testing
        sync_pin.lock().set_settlement_time(Duration::from_nanos(0));
        cm_pin.lock().set_settlement_time(Duration::from_nanos(0));
        ci_pin.lock().set_settlement_time(Duration::from_nanos(0));
        reset_pin
            .lock()
            .set_settlement_time(Duration::from_nanos(0));
        phi1_pin.lock().set_settlement_time(Duration::from_nanos(0));
        phi2_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d0_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d1_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d2_pin.lock().set_settlement_time(Duration::from_nanos(0));
        d3_pin.lock().set_settlement_time(Duration::from_nanos(0));

        // Test memory read at minimum timing
        // Note: Intel 4004 has a 4-bit data bus, so we can only read 4 bits at a time
        // The full 8-bit read would require M1/M2 cycles (not yet implemented)
        let address = 0x12;
        let expected_data = 0x04; // 4-bit value (low nibble only for single-cycle read)

        // Set up ROM data
        chip.load_rom_data(vec![expected_data], address).unwrap();

        // Test memory read using the helper function
        test_memory_read(
            &mut chip,
            &sync_pin,
            &cm_pin,
            &ci_pin,
            &phi1_pin,
            &phi2_pin,
            &d0_pin,
            &d1_pin,
            &d2_pin,
            &d3_pin,
            address as u8,
            expected_data,
        );

        // Verify state machine transitions correctly at minimum timing
        assert_eq!(chip.get_timing_state(), TimingState::Idle);

        // Test multiple consecutive reads at minimum timing
        // Note: Intel 4004 has a 4-bit data bus, so we can only read 4 bits at a time
        // The expected data must be a 4-bit value (0x00-0x0F)
        for addr in 0x10..0x15 {
            // Use 4-bit values that fit on the data bus
            let expected_data = (addr & 0x0F) as u8; // Low nibble only
            let test_data = vec![expected_data];
            chip.load_rom_data(test_data, addr).unwrap();
            test_memory_read(
                &mut chip,
                &sync_pin,
                &cm_pin,
                &ci_pin,
                &phi1_pin,
                &phi2_pin,
                &d0_pin,
                &d1_pin,
                &d2_pin,
                &d3_pin,
                addr as u8,
                expected_data,
            );
        }

        // Enhanced edge case testing for minimum access time

        // Test edge case: consecutive reads at minimum access time
        // Note: Intel 4004 has a 4-bit data bus, so expected data must be 0-15
        for address in 0x00..0x10 {
            // Use addresses 0x00-0x0F where low nibble equals address
            let expected_data = (address & 0x0F) as u8; // 4-bit value
            let result1 = test_memory_read_edge_case(
                &mut chip,
                &sync_pin,
                &cm_pin,
                &ci_pin,
                &phi1_pin,
                &phi2_pin,
                &d0_pin,
                &d1_pin,
                &d2_pin,
                &d3_pin,
                address as u16,
                expected_data,
            );
            assert_eq!(
                result1, expected_data,
                "Failed consecutive read 1 at address {} at minimum access time",
                address
            );
        }

        // Test edge case: rapid address changes at minimum access time
        // Note: Intel 4004 has a 4-bit data bus, so expected data must be 0-15
        let test_addresses = [0, 255, 128, 1, 254, 2, 253, 3];
        for &address in &test_addresses {
            let expected_data = (address & 0x0F) as u8; // 4-bit value for data bus
            chip.load_rom_data(vec![expected_data], address).unwrap();
            let result = test_memory_read_edge_case(
                &mut chip,
                &sync_pin,
                &cm_pin,
                &ci_pin,
                &phi1_pin,
                &phi2_pin,
                &d0_pin,
                &d1_pin,
                &d2_pin,
                &d3_pin,
                address as u16,
                expected_data,
            );
            assert_eq!(
                result, expected_data,
                "Failed rapid address change test at address {} at minimum access time",
                address
            );
        }

        // Test edge case: minimum access time with I/O operations
        // Note: Intel 4004 has a 4-bit data bus, so expected data must be 0-15
        chip.load_rom_data(vec![0x05], 0x00).unwrap(); // Test pattern (4-bit value)
        chip.load_rom_data(vec![0x0A], 0xFF).unwrap(); // Another test pattern (4-bit value)

        // Test I/O pin behavior during minimum access time reads
        let io_pins = ["IO0", "IO1", "IO2", "IO3"];

        // Set I/O pins to output mode
        for pin_name in &io_pins {
            let _io_pin = chip.get_pin(pin_name).unwrap();
            // Note: In the actual implementation, I/O pin mode is controlled through the chip's I/O methods
            // For this test, we'll verify the I/O functionality through the chip's methods
        }

        // Test memory read while I/O operations are active
        let result = test_memory_read_edge_case(
            &mut chip, &sync_pin, &cm_pin, &ci_pin, &phi1_pin, &phi2_pin, &d0_pin, &d1_pin,
            &d2_pin, &d3_pin, 0x00, 0x05,
        );
        assert_eq!(
            result, 0x05,
            "Failed memory read with active I/O at minimum access time"
        );

        // Test edge case: minimum access time with boundary addresses
        // Note: Intel 4004 has a 4-bit data bus, so expected data must be 0-15
        let boundary_addresses = [0, 1, 254, 255];
        for &address in &boundary_addresses {
            let expected_data = (address & 0x0F) as u8; // 4-bit value for data bus
            chip.load_rom_data(vec![expected_data], address).unwrap();
            let result = test_memory_read_edge_case(
                &mut chip,
                &sync_pin,
                &cm_pin,
                &ci_pin,
                &phi1_pin,
                &phi2_pin,
                &d0_pin,
                &d1_pin,
                &d2_pin,
                &d3_pin,
                address as u16,
                expected_data,
            );
            assert_eq!(
                result, expected_data,
                "Failed boundary address test at {} at minimum access time",
                address
            );
        }

        // Test state machine transitions at minimum access time
        // Verify proper state progression through all phases
        // Note: Intel 4004 has a 4-bit data bus, so we can only read 4 bits at a time
        let mut test_chip = Intel4001::new_with_access_time("STATE_TEST_ROM".to_string(), 200);
        test_chip.base.set_running(true);
        test_chip.load_rom_data(vec![0x02], 0x10).unwrap(); // 4-bit value (low nibble only)

        // Get pins for state machine test
        let test_sync = test_chip.get_pin("SYNC").unwrap();
        let test_cm = test_chip.get_pin("CM").unwrap();
        let test_ci = test_chip.get_pin("CI").unwrap();
        let test_phi1 = test_chip.get_pin("PHI1").unwrap();
        let test_phi2 = test_chip.get_pin("PHI2").unwrap();

        // Set settlement times to 0
        test_sync
            .lock()
            .set_settlement_time(Duration::from_nanos(0));
        test_cm.lock().set_settlement_time(Duration::from_nanos(0));
        test_ci.lock().set_settlement_time(Duration::from_nanos(0));
        test_phi1
            .lock()
            .set_settlement_time(Duration::from_nanos(0));
        test_phi2
            .lock()
            .set_settlement_time(Duration::from_nanos(0));

        // Initialize PHI2 to Low to ensure proper edge detection
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();

        // Manually step through the state machine to verify timing
        // Set control pins for memory read
        {
            let mut sync_guard = test_sync.lock();
            let mut cm_guard = test_cm.lock();
            let mut ci_guard = test_ci.lock();
            sync_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            cm_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            ci_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();
        assert_eq!(test_chip.get_timing_state(), TimingState::Idle);

        // Ensure PHI1 is low initially
        {
            let mut phi1_guard = test_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();

        // Start address phase - write high nibble BEFORE PHI1 rising (ROM latches on rising edge)
        test_chip.write_data_bus(0x01); // High nibble
        {
            let mut phi1_guard = test_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        test_chip.update();
        assert_eq!(test_chip.get_timing_state(), TimingState::AddressPhase);

        // PHI1 falling edge
        {
            let mut phi1_guard = test_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();

        // Write low nibble BEFORE PHI1 rising
        test_chip.write_data_bus(0x00); // Low nibble
        {
            let mut phi1_guard = test_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        test_chip.update();
        assert_eq!(test_chip.get_timing_state(), TimingState::WaitLatency);

        // Release data bus
        for i in 0..4 {
            let pin = test_chip.get_pin(&format!("D{}", i)).unwrap();
            let mut pin_guard = pin.lock();
            pin_guard.set_driver(Some("TEST".to_string()), PinValue::HighZ);
        }

        // Cycle through a3_wait_cycles with PHI2 edges (one pin per update)
        // PHI1 high to low
        {
            let mut phi1_guard = test_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();
        // PHI2 low to high: a3_wait_cycles 1→0
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        test_chip.update();
        // PHI2 high to low
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();
        // PHI2 low to high: WaitLatency → DriveData (no data drive)
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        test_chip.update();
        // PHI2 high to low
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();
        // PHI2 low to high: drives OPR (high nibble)
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        test_chip.update();
        assert_eq!(test_chip.get_timing_state(), TimingState::DriveData);

        // Read OPR (high nibble) — for data 0x02, OPR = 0
        let opr = test_chip.read_data_bus();
        assert_eq!(opr, 0x00, "OPR should be high nibble of 0x02");

        // PHI2 high to low: toggle to OPA phase
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();
        // PHI2 low to high: drives OPA (low nibble)
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        test_chip.update();

        // Read OPA (low nibble) — for data 0x02, OPA = 2
        let opa = test_chip.read_data_bus();
        assert_eq!(opa, 0x02, "OPA should be low nibble of 0x02");

        // Combine and verify
        let data = (opr << 4) | opa;
        assert_eq!(data, 0x02);

        // Drop SYNC/CM and complete cycle
        {
            let mut sync_guard = test_sync.lock();
            sync_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        {
            let mut cm_guard = test_cm.lock();
            cm_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        {
            let mut phi2_guard = test_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        test_chip.update();
        assert_eq!(test_chip.get_timing_state(), TimingState::Idle);

        // Test edge case: timing violations at minimum access time
        // Test what happens when we try to read too quickly
        let mut fast_chip = Intel4001::new_with_access_time("FAST_VIOLATION_ROM".to_string(), 200);
        fast_chip.base.set_running(true);
        fast_chip.load_rom_data(vec![0x09], 0x50).unwrap(); // Use 4-bit value (0x09)

        let fast_sync = fast_chip.get_pin("SYNC").unwrap();
        let fast_cm = fast_chip.get_pin("CM").unwrap();
        let fast_ci = fast_chip.get_pin("CI").unwrap();
        let fast_phi1 = fast_chip.get_pin("PHI1").unwrap();
        let fast_phi2 = fast_chip.get_pin("PHI2").unwrap();

        // Set settlement times to 0
        fast_sync
            .lock()
            .set_settlement_time(Duration::from_nanos(0));
        fast_cm.lock().set_settlement_time(Duration::from_nanos(0));
        fast_ci.lock().set_settlement_time(Duration::from_nanos(0));
        fast_phi1
            .lock()
            .set_settlement_time(Duration::from_nanos(0));
        fast_phi2
            .lock()
            .set_settlement_time(Duration::from_nanos(0));

        // Initialize PHI2 to Low to ensure proper edge detection
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();

        // Set up for memory read
        {
            let mut sync_guard = fast_sync.lock();
            let mut cm_guard = fast_cm.lock();
            let mut ci_guard = fast_ci.lock();
            sync_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            cm_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            ci_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();

        // Ensure PHI1 is low initially
        {
            let mut phi1_guard = fast_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();

        // Write high nibble BEFORE PHI1 rising (ROM latches on rising edge)
        fast_chip.write_data_bus(0x05); // High nibble of address 0x50
        {
            let mut phi1_guard = fast_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        fast_chip.update();

        // PHI1 falling edge
        {
            let mut phi1_guard = fast_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();

        // Write low nibble BEFORE PHI1 rising
        fast_chip.write_data_bus(0x00); // Low nibble of address 0x50
        {
            let mut phi1_guard = fast_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        fast_chip.update();

        // Should be in WaitLatency now
        let state = fast_chip.get_timing_state();
        assert_eq!(state, TimingState::WaitLatency, "Expected WaitLatency, got {:?}", state);

        // Release data bus
        for i in 0..4 {
            let pin = fast_chip.get_pin(&format!("D{}", i)).unwrap();
            let mut pin_guard = pin.lock();
            pin_guard.set_driver(Some("TEST".to_string()), PinValue::HighZ);
        }

        // Cycle PHI2 to get through a3_wait_cycles and DriveData
        // PHI1 high to low
        {
            let mut phi1_guard = fast_phi1.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();
        // PHI2 low to high: a3_wait_cycles 1→0
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        fast_chip.update();
        // PHI2 high to low
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();
        // PHI2 low to high: WaitLatency → DriveData (no data)
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        fast_chip.update();
        // PHI2 high to low
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();
        // PHI2 low to high: drives OPR
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        fast_chip.update();

        // Read OPR (high nibble of 0x09 = 0)
        let opr = fast_chip.read_data_bus();
        assert_eq!(opr, 0x00, "OPR should be high nibble of 0x09");

        // PHI2 high to low: toggle to OPA
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        fast_chip.update();
        // PHI2 low to high: drives OPA
        {
            let mut phi2_guard = fast_phi2.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        fast_chip.update();

        // Read OPA (low nibble of 0x09 = 9)
        let opa = fast_chip.read_data_bus();
        assert_eq!(opa, 0x09, "OPA should be low nibble of 0x09");

        // Verify full byte
        let data = (opr << 4) | opa;
        assert_eq!(data, 0x09);
    }

    // Helper function for edge case memory read testing
    fn test_memory_read_edge_case(
        chip: &mut Intel4001,
        sync_pin: &Arc<Mutex<Pin>>,
        cm_pin: &Arc<Mutex<Pin>>,
        ci_pin: &Arc<Mutex<Pin>>,
        phi1_pin: &Arc<Mutex<Pin>>,
        phi2_pin: &Arc<Mutex<Pin>>,
        _d0_pin: &Arc<Mutex<Pin>>,
        _d1_pin: &Arc<Mutex<Pin>>,
        _d2_pin: &Arc<Mutex<Pin>>,
        _d3_pin: &Arc<Mutex<Pin>>,
        address: u16,
        expected_data: u8,
    ) -> u8 {
        // Load the expected data into ROM at the specified address
        chip.load_rom_data(vec![expected_data], address as usize)
            .unwrap();

        // Reset to known state
        chip.perform_reset();
        chip.update();

        // Start the component
        chip.base.set_running(true);

        // Set control pins for memory read
        {
            let mut sync_guard = sync_pin.lock();
            let mut cm_guard = cm_pin.lock();
            let mut ci_guard = ci_pin.lock();
            sync_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            cm_guard.set_driver(Some("TEST".to_string()), PinValue::High);
            ci_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Ensure PHI2 is low initially
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Ensure PHI1 is low initially
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Set high nibble on data bus BEFORE PHI1 rising (ROM latches on rising edge)
        chip.write_data_bus(((address >> 4) & 0x0F) as u8);

        // PHI1 low to high: ROM latches high nibble on rising edge
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        chip.update();

        // PHI1 high to low
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Set low nibble on data bus BEFORE PHI1 rising
        chip.write_data_bus((address & 0x0F) as u8);

        // PHI1 low to high: ROM latches low nibble, address complete → WaitLatency
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        chip.update();

        // Should be in WaitLatency now
        let state = chip.get_timing_state();
        assert!(
            state == TimingState::WaitLatency,
            "Expected WaitLatency after latching both nibbles, got {:?}",
            state
        );

        // Release data bus from test control to allow ROM to drive it
        for i in 0..4 {
            let pin = chip.get_pin(&format!("D{}", i)).unwrap();
            let mut pin_guard = pin.lock();
            pin_guard.set_driver(Some("TEST".to_string()), PinValue::HighZ);
        }

        // Cycle through a3_wait_cycles: need multiple PHI2 rising edges
        // IMPORTANT: Only change ONE pin per update() call to avoid spurious edge detection.
        // The ROM detects edges by comparing current vs previous pin values.

        // Step 1: PHI1 high to low (PHI2 stays low from before)
        {
            let mut phi1_guard = phi1_pin.lock();
            phi1_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Step 2: PHI2 low to high (a3_wait_cycles decrements)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        chip.update();

        // Step 3: PHI2 high to low
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Step 4: PHI2 low to high (a3_wait_cycles=0, transitions WaitLatency → DriveData)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        chip.update();

        // Step 5: PHI2 high to low
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Step 6: PHI2 low to high: first data drive = OPR (high nibble)
        // After step 4 transitioned to DriveData, this is the first PHI2 rising
        // where the ROM actually drives data (nibble_phase=false = OPR)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        chip.update();

        // Read OPR (high nibble) from data bus
        let opr = chip.read_data_bus();

        // Step 7: PHI2 high to low: ROM toggles nibble phase to OPA
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();

        // Step 8: PHI2 low to high: second data drive = OPA (low nibble)
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::High);
        }
        chip.update();

        // Read OPA (low nibble) from data bus
        let opa = chip.read_data_bus();

        // Drop SYNC/CM to prevent ROM from re-triggering
        {
            let mut sync_guard = sync_pin.lock();
            sync_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        {
            let mut cm_guard = cm_pin.lock();
            cm_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }

        // PHI2 high to low: ROM returns to Idle
        {
            let mut phi2_guard = phi2_pin.lock();
            phi2_guard.set_driver(Some("TEST".to_string()), PinValue::Low);
        }
        chip.update();
        assert_eq!(chip.get_timing_state(), TimingState::Idle);

        // Combine OPR and OPA to form the full byte
        let data = (opr << 4) | opa;
        assert_eq!(data, expected_data);

        data
    }
}